EIAJ ED 4701 PDF

JEITA EIAJ Standards (as of August in ). General System, Category and Title , Spec. No. (Test No.) Life Test, JEITA EIAJ ED/ Life TestⅠ, Steady. Japan Electronics and Information Technology Industries Association (JEITA) Standards EIAJ ED/ Environmental and endurance test methods for. EIAJ ED/ Test Method Ta=85°C, 85%RH, Vcc=80V, Vdd=6V. hrs. 0/ AC. EIAJ ED B Ta=°C,%RH.

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The ambient temperature in operating state. The temperature of the air at a place separated by a distance sufficient to neglect the influence of the heat radiation from the specimen, when it is cooled by natural convection.

NPC Reliability Testing

Junichi Mitsuhashi Mitsubishi Electric Corp. Standard diagram and category are shown in Figure 9, and Table 1. Electromagnetic compatibility wikipedialookup.

Hence there are concerns about the possibility of a similar failure mode. Naohiro Yasuda Fuji Electric Co. Tetsuji Matsuura Toshiba Corp. Back to the main subject. Portable appliance testing wikipedia fd, lookup.

SiC Power Device

By continuing to browse this website without changing your web-browser cookie settings, you are agreeing to our use of cookies. However, the reader can consider the data that we shall present below. Atsushi Natsume Sony Corp. But, the new endurance test methods become to 2 kinds of specific test methods that are endurance test and intermittent operation life test. The materials used to test the specimens. Climatic test methods C: In particular, power devices are intended to handle large amounts of power, and so must attain satisfactory reliability.

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The final revision planing was decided to above-mentioned 6 separate volumes.

Standards Related to Reliability Test |Sanken Electric

In particular, utmost attention should be paid to the precautions indicated in the detail specifications. This website uses cookies.

The life tests and the strength tests was subdivided according to the revision frequency. The ambient temperature when the specimen is stored in inoperative state.

Kouji Obinata Sony Corp. Below are listed the members of deliberation of this standard. JEITA ED is a standard for “environmental and endurance test methods for semiconductor devices”, and describes testing methods for evaluating semiconductor devices for industry and consumers.

A new and old classification method is shown in Comment Table 1. In conformity the relevant specifications when the specimen is cooled by forced convection. Masashi Kusuda Mitsumi Electric Co. The junction temperature of the specimen. The visual inspection and the electrical and optical measurements which the specimens are submitted to in the first place before carrying out the tests.

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Reliability Evaluation Fee

Semiconductor device wikipedialookup. This standard is widely adopted in Japan. The sequence according to which the various kinds of treatments, measurements, conditionings, inspections, etc.

Main revision points are as wd. When evaluating semiconductor devices, in addition to the electrical and mechanical specifications and performance, reliability is another important factor.

Mechanical test methods B: Reliability of Dd Because SiC does not have a long history as a semiconductor material, and because it does not have much of a track record compared with Si power devices, there may not be much awareness of the level of its reliability.

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